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The University of Oregon’s John Donovan was awarded the 2010 Presidential Science Award from the New York-based Microscopy Society of America on Aug. 2 during the opening plenary session of the society’s annual Microscopy & Microanalysis conference at the Oregon Convention Center in Portland.
The society’s outgoing President Edward P. Vicenzi of the Smithsonian Institution chose Donovan, who has served as director of the UO’s MicroAnalytical Facility at CAMCOR (one of ONAMI’s Signature Research Facilities in our NW NanoNetwork) since December 2001, for the award. Initiated in 1977, the award honors a senior scientist for outstanding technical contributions to the field of microanalysis over a sustained period of time.
The citation noted that Donovan’s “many contributions to the field are centered around the accuracy and precision of X-ray microanalysis measurements, including: spectral interferences, peak shape and shift characterization for light element and chemical state analysis, matrix corrections, continuum modeling, and secondary fluorescence effects that mask trace element signals in polyphase materials.” Donovan was the first to “reliably estimate, and correct for, the time-dependent effects observed in beam sensitive samples in real time - a previously vexing problem for analysts”.
In addition to his duties at UO, Donovan is also the founder and president of Probe Software, Inc., which develops and sells a range of software products for Electron Probe MicroAnalysis (EPMA).
Probe Software and ONAMI are both exhibitors at the M&M Conference.