X-ray Photoelectron Spectroscopy, Kratos Analytical Model Hsi
Facility: Center For Advanced Materials Characterization in Oregon (CAMCOR)

-Identification of all elements (except H and He) present in the outermost 100 angstroms of a surface in concentrations > 0.1 atomic % -Determination of the elemental surface composition (+ or -10%) -Information on lateral variation in composition (resolution approx 150 microns) -Information about the molecular environment (oxidation state, bonding atoms, etc.) -Also known as Electron Spectroscopy for Chemical Analysis (ESCA)

Function
chemical bonding information
depth profiling
elemental analysis
Surface analysis
thin film analysis
UPS

Technique
ESCA
Photoelectron Spectroscopy
Ultraviolet Photoelectron Spectroscopy
UPS
X-ray Photoelectron Spectroscopy
XPS

Contact Center For Advanced Materials Characterization in Oregon (CAMCOR)

Name: Email: Phone: Reason: Note: Functions: chemical bonding information depth profiling elemental analysis Surface analysis thin film analysis UPS Techniques: ESCA Photoelectron Spectroscopy Ultraviolet Photoelectron Spectroscopy UPS X-ray Photoelectron Spectroscopy XPS