Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) ION TOF Model IV
Facility: Center For Advanced Materials Characterization in Oregon (CAMCOR)

ToF-SIMS provides: -A mass spectrum of the outermost 12 angstroms of a surface -Identification of structural units present at the surface (e.g. monomeric components and repeat units) -Fingerprint identification of polymers -Information on surface degradation and contamination -Spatial imaging of the surface chemistry -A full mass spectrum from every pixel of an image -High mass resolution -Extremely high analytical sensitivity -Destructive elemental depth profiles several thousand angstroms into the sample

Function
depth profiling
elemental analysis
imaging
ion-induced secondary electron imaging
Surface analysis
thin film analysis
trace analysis
variable temperature capability

Technique
Mass Spectrometer
SIMS
Time of Flight Secondary Ion Mass Spectrometer
Tof-SIMS

Contact Center For Advanced Materials Characterization in Oregon (CAMCOR)

Name: Email: Phone: Reason: Note: Functions: depth profiling elemental analysis imaging ion-induced secondary electron imaging Surface analysis thin film analysis trace analysis variable temperature capability Techniques: Mass Spectrometer SIMS Time of Flight Secondary Ion Mass Spectrometer Tof-SIMS