FEI Environmental SEM Scanning Electron Microscope
Facility: Center For Advanced Materials Characterization in Oregon (CAMCOR)

Environmental Scanning Electron Microscope for running uncoated non-conductive and/or wet samples at high resolution (<5nm). EDS 30mm^2 SDD system for fast x-ray mapping (>200K cps) and electron backscatter diffraction (EBSD) for polycrystalline texture and orientation mapping.

Function
backscatter
BSE
cathodo-luminescence
CL
EBSD
EDS
electron imaging
energy dispersive
gas amplified secondary detection
high-resolution TEM
insulating samples
low voltage
OIM
orientation imaging
peltier cooling stage
SE
secondary
spectrum imaging
wet imaging

Technique
environmental
ESEM
scanning electron microscope
SEM
thermal field emission
variable pressure
VPSEM

Contact Center For Advanced Materials Characterization in Oregon (CAMCOR)

Name: Email: Phone: Reason: Note: Functions: backscatter BSE cathodo-luminescence CL EBSD EDS electron imaging energy dispersive gas amplified secondary detection high-resolution TEM insulating samples low voltage OIM orientation imaging peltier cooling stage SE secondary spectrum imaging wet imaging Techniques: environmental ESEM scanning electron microscope SEM thermal field emission variable pressure VPSEM