Cameca SX50 Electron Microanalyzer
Facility: Center For Advanced Materials Characterization in Oregon (CAMCOR)

Electron Probe Micro Analyzer with 4 WDS spectrometers, SE and BSE imaging for high accuracy multi-voltage thin film analysis and elemental quantification. Wide area SE, BSE, and x-ray mapping using MicroImage image acquisition. Runs Probe for Windows software for advanced automation and analysis.

Function
backscatter
BSE
elemental analysis
energy dispersive
imaging
microanalysis
SE
secondary
thin film analysis
trace analysis
wavelength dispersive
x-ray mapping

Technique
electron microprobe
electron probe
EPMA
microanalyzer

Contact Center For Advanced Materials Characterization in Oregon (CAMCOR)

Name: Email: Phone: Reason: Note: Functions: backscatter BSE elemental analysis energy dispersive imaging microanalysis SE secondary thin film analysis trace analysis wavelength dispersive x-ray mapping Techniques: electron microprobe electron probe EPMA microanalyzer