Center For Advanced Materials Characterization in Oregon (CAMCOR)
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CAMCOR is a full-service, comprehensive materials characterization center located at the University of Oregon in Eugene. Its core capabilities include microanalysis, surface analysis, electron microscopy, semiconductor device fabrication, as well as traditional chemical characterization.
CAMCOR's world-class scientists are expertly trained and highly experienced in sample preparation, data collection and analysis, and precision microanalysis techniques. They provide assistance on characterization techniques to researchers throughout the ONAMI community.
CAMCOR comprises five laboratories and more than 20 high-tech instruments.
The MicroAnalytical Facility provides high accuracy microscale quantitative measurements for both chemical composition and physical structure on a variety of materials, including minerals, glasses, ceramics, thin films, bulk materials, semi-conductors, nano-devices and electro-optical materials. The MicroAnalytical facility provides resources for sample preparation and materials analysis by scanning electron microscopy and electron microprobe analysis.
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The Nanofabrication and Imaging Facility provides microscopy applications and techniques from the light level to electron microscopy. The facility provides photographic services, light microscopy, transmission electron microscope with cryo capabilities, and a multiphoton scanning laser fluorescence microscope.
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The Surface Analytical Laboratory houses instrumentation for characterizing the composition of the outermost few nanometers of materials, and for imaging surface topography and chemistry. Techniques available include X-Ray Photoelectron Spectroscopy (XPS), Time of flight secondary ion mass spectrometry (ToF SIMS), Spectroscopic Ellipsometry and Atomic Force Microscopy (AFM).
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Chemical Research Instrumentation Services features state-of-the-art instrumentation for traditional molecular characterization. Two full-time doctorate-level instrumentation specialists oversee the installation of new instruments, perform routine maintenance on existing instruments in CRIS and facilitate training for new users. They are also available for consultation on advanced experimental protocols and have particular expertise in the areas of nuclear magnetic resonance (NMR) spectroscopy and x-ray diffraction.
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The Device Fabrication and Characterization Lab provides facilities for making and studying semiconductor device physics and chemistry. The laboratory houses photolithography, high-vacuum deposition, and other semiconductor device processing equipment as well as instrumentation for the electrical characterization of materials and devices.
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Atomic Force Microscope Digital Instruments Multimode Microscope Cameca SX100 Electron Microanalyzer Cameca SX50 Electron Microanalyzer FEI Environmental SEM Scanning Electron Microscope Helios DualBeam Scanning Auger Microscope, PHI Model 670 with 680 upgrade Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) ION TOF Model IV Titan 80-300 S/TEM X-ray Photoelectron Spectroscopy, Kratos Analytical Model Hsi Zeiss Ultra-55 SEM scanning electron microscope |  |
